Automation of a bank of measurements for large signal characterization
DOI:
https://doi.org/10.18046/syt.v12i30.1857Keywords:
Characterization, RF / Microwave, scattering, vector network analyzer.Abstract
This paper shows a strategy for the measurement and characterization of Radio Frequency and Microwave circuits (RF / Microwave), which are used in modern wireless communication systems, through a designed software able to capture and control, remotely, the collected data by the measurement setup –in this case, a vector network analyzer R&S ZVA8 and a digital multimeter DM3061). As evidence, the characterization of a high efficiency Power Amplifier [PA] has been carried out, using this strategy, at a test frequency of 2.4 GHz.References
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Colantonio, P., Gianini, F., Limiti, E. (2009). High efficiency RF and microwave solid state power Amplifiers. Chichester, UK: Wiley.
Ferrero, A., Garelli, A., Grossman, B., Choon, S., & Teppati, V. (2011). Uncertainty in multiport S-parameters measurements. In 2011 77th ARFTG Microwave Measurement Conference: Design and Measurement of Microwave Systems, ARFTG 2011, (paper3.3). Piscataway, NJ: IEEE.
Fu, Y., Dussopt, L., Vuong, T.P., & Ndagijimana, F. (2012). Characterization of integrated antennas at millimeter-wave frequencies. International Journal of Microwave and Wireless Technologies, 4(1), 15.22.
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Griffin, J. D., Durgin, G. D., Haldi, A. &Kippelen, B. (2006). How to construct a test bed for RFID antenna measurements. IEEE Antennas and Propagation Society International Symposium 2006, (pp. 457-460). Piscataway, NJ: IEEE.
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Mabrouk, M. (2010). RF and microwave production test requirements for advanced mixed-signal devices. In 2010 11th Latin American Test Workshop (LATW), (pp.1-4). Piscataway NJ: IEEE.
Mehdi, H., Mons, S., Bennadji, A., Ngoya, E., & Quere, R. (2011). Improvement of the envelope - Transient S-parameters’ simulation in circuit and system simulation. International Journal of Microwave and Wireless Technologies, 3(6), 657-665.
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Padilla-Corral, S., & García-Ruiz, I. (2010). Estimación de la incertidumbre de la medición de un analizador vectorial de redes. Simposio de Metrología, 2010 (S3-D31) [on line]. Retrieved from https://www.cenam.mx/sm2010/info/pjueves/sm2010-jp04d.pdf
Raab, F.H., et al. (2002). Power amplifiers and transmitters for RF and microwave. IEEE Transactions on Microwave Theory and Techniques, 50(3), 814-826.
Raffo, A., Giacomo, V. Di, Member, S., Traverso, P. A., Santarelli, A., & Vannini, G. (2009). An automated measurement system for the characterization of electron device degradation under nonlinear dynamic regime. IEEE Transactions on Instrumentation and Measurement, 58(8), 2663-2670.
Rolfes, I., Will, B., & Schiek, B. (2008). Calibration-measurement unit for the automation of vector network analyzer measurements. Advances in Radio Science, 6, 27-30.
Su, Y., Liu, L., & Gao, K. (2010). Research of an Automatic RF Devices Characteristic Test Bench for DC and Scattering Parameters Measurement. In 2010 2nd International Conference on Information Engineering and Computer Science, (pp.1-4). Piscataway, NJ: IEEE
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Zhao, W., Zhao, Y.-J., Qin, H.-B., Qiang, L., & Liu, B. (2010). Calibration algorithm of the n-port vector network analyzer using the general node equation. IET Science, Measurement & Technology, 4(6), 298-302.
Colantonio, P., Gianini, F., Limiti, E. (2009). High efficiency RF and microwave solid state power Amplifiers. Chichester, UK: Wiley.
Ferrero, A., Garelli, A., Grossman, B., Choon, S., & Teppati, V. (2011). Uncertainty in multiport S-parameters measurements. In 2011 77th ARFTG Microwave Measurement Conference: Design and Measurement of Microwave Systems, ARFTG 2011, (paper3.3). Piscataway, NJ: IEEE.
Fu, Y., Dussopt, L., Vuong, T.P., & Ndagijimana, F. (2012). Characterization of integrated antennas at millimeter-wave frequencies. International Journal of Microwave and Wireless Technologies, 4(1), 15.22.
González, G. (1997). Microwave transistor amplifiers, analyses and design. Englewood Cliffs, NJ: Prentice-Hall.
Griffin, J. D., Durgin, G. D., Haldi, A. &Kippelen, B. (2006). How to construct a test bed for RFID antenna measurements. IEEE Antennas and Propagation Society International Symposium 2006, (pp. 457-460). Piscataway, NJ: IEEE.
IEEE (2013). IEEE 802.3. Ethernet. Retrieved from http://standards.ieee.org/about/get/802/802.3.html
Ishida, T., Yamaguchi, K., Ishizaki, T., & Awai, I. (2012). FRI-H-4 Novel measurement technique of WPT circuits using VNA and its data Transformation into 0-ohm System. In IEEE MTT-S International Microwave Workshop Series on Innovative Wireless Power Transmission: Technologies, Systems, and Applications (IMWS), 2012, (pp. 231–234. Piscataway NJ: IEEE.
Leskovar, B. (1978).Charge-coupled device high-frequency drivers and testing instruments [Report to US Department of Energy under Contract W-7405-ENG-48].Available at https://publications.lbl.gov/islandora/object/ir%3A106393
Linares y Miranda, R., González-Jaimes, H.E., & López-Bonilla, J. (2010). Una propuesta didáctica para la caracterización de dispositivos y redes eléctricas de radiofrecuencia en la banda de 100 khz a 500 mhz. Ingeniare. Revista Chilena de Ingenieria, 18(3), 295-301.
Mabrouk, M. (2010). RF and microwave production test requirements for advanced mixed-signal devices. In 2010 11th Latin American Test Workshop (LATW), (pp.1-4). Piscataway NJ: IEEE.
Mehdi, H., Mons, S., Bennadji, A., Ngoya, E., & Quere, R. (2011). Improvement of the envelope - Transient S-parameters’ simulation in circuit and system simulation. International Journal of Microwave and Wireless Technologies, 3(6), 657-665.
National Instruments [NI] (s.f). Guía sobre control de instrumentos por USB, [on line]. Retrieved from http://sine.ni.com/np/app/main/p/ap/ictrl/lang/es/pg/1/sn/n17:ictrl,n21:25/fmid/6000/
National Instruments [NI]. (2013, August 21th). Understanding LAN / LXI for Instrument Control [on line]. Retrieved from http://www.ni.com/white-paper/2922/en/
Padilla-Corral, S., & García-Ruiz, I. (2010). Estimación de la incertidumbre de la medición de un analizador vectorial de redes. Simposio de Metrología, 2010 (S3-D31) [on line]. Retrieved from https://www.cenam.mx/sm2010/info/pjueves/sm2010-jp04d.pdf
Raab, F.H., et al. (2002). Power amplifiers and transmitters for RF and microwave. IEEE Transactions on Microwave Theory and Techniques, 50(3), 814-826.
Raffo, A., Giacomo, V. Di, Member, S., Traverso, P. A., Santarelli, A., & Vannini, G. (2009). An automated measurement system for the characterization of electron device degradation under nonlinear dynamic regime. IEEE Transactions on Instrumentation and Measurement, 58(8), 2663-2670.
Rolfes, I., Will, B., & Schiek, B. (2008). Calibration-measurement unit for the automation of vector network analyzer measurements. Advances in Radio Science, 6, 27-30.
Su, Y., Liu, L., & Gao, K. (2010). Research of an Automatic RF Devices Characteristic Test Bench for DC and Scattering Parameters Measurement. In 2010 2nd International Conference on Information Engineering and Computer Science, (pp.1-4). Piscataway, NJ: IEEE
Zhao, W., Zhao, Y.-J., & Qin, H.-B. (2010). Calibration of the three-port VNA using the general 6-term error model. Journal of Electromagnetic Waves and Applications, 24(2-3), 319-326.
Zhao, W., Zhao, Y.-J., Qin, H.-B., Qiang, L., & Liu, B. (2010). Calibration algorithm of the n-port vector network analyzer using the general node equation. IET Science, Measurement & Technology, 4(6), 298-302.
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2014-09-30
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